رشد تک‌بلور نیمرسانای Te04/0Zn96/0Cd به دو روش بریجمن تغییریافته و ترابری فاز بخار

نویسندگان

پردیس دانشگاه فردوسی

چکیده

تک­بلورهای Te04/0Zn96/0Cd (CZT) با قطر تا mm 14 به روش بریجمن تغییریافته و بدون استفاده از هسته اولیه، رشد داده ­شدند. بلورهایی با همان ترکیب شیمیایی به روش انتقال فاز بخار به­وسیله گاز بی­اثر (VPGT) نیز رشد داده شد که تک­بلورهایی به بزرگی تا mm 5/3 به دست آمد. مطالعات ساختاری انجام شده با پراش پرتو X و تصاویر پس­بازتاب لاوه نشان می­دهند که بلورهای رشد یافته تک­فازند و ترجیحاً به موازات محور بلور ]111[ رشد می­کنند. گاف انرژی بلورهای رشد داده شده در حدود eV 2/1 است. خواص الکتریکی اندازه گیری شده به روش وندرپو نشان می­دهند که مرتبه بزرگی مقاومت ویژه تک­بلورهای حاصل W.cm104 است. رسانندگی الکتریکی بلورهای رشد داده شده به روش بریجمن نوع p < /span>، و بلورهای رشد داده شده به روش VPGT نوع n است.

کلیدواژه‌ها


عنوان مقاله [English]

Growth of semiconducting Cd0.96Zn0.04Te single crystal by modified Bridgman and vapor phase transport methods

چکیده [English]

Single crystals of Cd.96Zn.04Te (CZT) with 14 mm in diameter were grown by seedless modified Bridgman method. Also, crystals with the same chemical composition were grown by vapor phase inert gas-transport method (VPGT), and single crystals up to 3.5 mm in diameter were obtained. Structural studies by XRD and back reflection Laue method show that the grown crystals are single phase with high purity, which preferentially have been grown along [111] crystal axis. The energy gap of as-grown crystals is about 1.2 eV. The electrical properties measured by Van der Pauw method, show that the resistivity is in order of 104 W.cm. The electrical conductivity of crystals grown by Bridman method is p-type, and for VPGT-crystals is n-type.

کلیدواژه‌ها [English]

  • crystal growth
  • Semiconductor
  • Bridgman
  • vapor phase transport
  • Cd-Zn-Te
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