Effects of Annealing on the Crystal Structure of Polycrystalline CdS Thin Films

Abstract

CdS thin films were deposited by thermal evaporation in a vacuum of ~ 10-5 torr at room temperature. Samples were subjected to annealing in the range of temperatures 100-300 oC for 1 hour in air.The crystal structure of CdS films was characterized by XRD technique. Only hexagonal phase with the preferred (002) plane was found in CdS films

Keywords


[1] Senthil K., Mangalaraj D., Narayandass Sa. K., “Structural and properties of CdS thin films”, Applied Surface Science 169-170 (2001) 476-479.

[2] He Z., Zhao G., Weng W., Du P., Han G., “The difference between the transverse and in-plane resistivity of vacuum evaporated cadmium sulfide (CdS) thin films”, Vacuum 79 (2005) 14-18

[3] Lozada-Morales R., Zelaya-Angel O., Torres-Delgado G., “On the yellow-band emission in CdS films”, Appl. Phys. A 73 (2001) 61-65

[4] Lee J., Yi J., Yang K., Magalaraj D., “Argon implantation effects on the structural and the optical properties of vacuum evaporated CdS thin films”, Journal of the korean physical society, Vol. 40 N. 5 (2002) 877-882

[5] Kashiwaba Y., Komatsu T., Nishikawa M., Ishikawa Y., Segawa K., Haysi Y., “X-Ray diffraction studies of p-CdS: Cu thin films”, Thin Solid Films 408 (2002) 43-50

[6] Bacaksiz E., Novruzov V., Karal H., Yanmaz E., Altunbas M., I. Kopya A., “Light-assisted deposition of CdS thin films”, J. Phys. D: Appl. Phys. 34 (2001) 3109-3112

[7] Senthil K., Mangalaraj D., Narayandass Sa. K., Kesavanmoorthy R., Reddy G. L. N., Sundaravel B., “Investigation on nitrogen ion implantation effects in vacuum evaporated CdS thin films using raman scattering and X ray diffraction studies”, physica B 304 (2002) 175-180

[8] Dzhafarov T. D., Altunbas M., Kopya A. I., Novruzov V. and Bacaksiz E., “Formation of p-type CdS thin films by laser-stimulated copper diffusion”, J. Phys. D: Appl. Phys. 32 (1999) L125-L125

[9] Cha D., Kim S., Huang N. K., “Study on electrical properties of CdS films prepared by chemical pyrolysis deposition”, Materials Science and Engineering B 106 (2004) 63-68

[10] Castillo S. J., Mendoza-Galvan A., Ramirez-Bon R., Espinoza-Beltran F. J., “Structural, optical and electrical characterization of In/CdS/glass thermally annealed system”, Thin Solid Films 373 (2000) 10-14

[11] Oladeji I. O., Chow L., Liu J. R., Chu w. K., Bustamante A. N. P., Fredricksen C., Schulte A. F., “Comparative study of CdS thin films deposited by single, continuous, and multiple dip chemical processes”, Thin Solid Films 356 (2000) 154-159

[12] George P. J., Sanchez-Juarez A. and Nair P. K., “Modification of electrical, optical and crystalline properties of chemically deposited CdS films by thermal diffusion of indium and tin”, Semicond. Sci. Technol. 11 (1996)1090-1095

[13] Mahmoud S. A., Ibrahim A. A., Riad A. S., “Physical properties of thermal coating CdS thin films using a modified evaporation source", Thin Solid Films 372 (2000) 144-148

[14] Vigil O., Zelaya-Angel O., Rodriguez Y., “Changes of the structural and optical properties of cubic CdS films on annealing in H2 and air atmospheres”, Semicond. Sci. Technol. 15 (2000) 259-262

[15] آشوری. حسین، "بلورشناسی – مطالعه بلورها و کاربرد اشعه ایکس در بلور شناسی"، انتشارات جهاد دانشگاهی واحد دانشگاه صنعتی اصفهان، 1379.